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UDR-204
Manual de instrucciones
UNIMO Technology UDR-204 Manual de instrucciones Pagina 122
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NanoScope Software Version 5
1
004-210-000
1
004-210-100
1
Ta ble of Contents
3
List of Figures
13
Instruments MultiMode SPM
21
1.1 Introduction
22
monitor
23
1.2 Safety
24
1.2.2 Safety Requirements
25
1.2.3 Safety Precautions
26
1.3 Microscope Specifications
33
Microscope Specifications
34
MultiMode
37
2.1 Hardware
38
2.1.1 MultiMode SPM
39
2.1.2 SPM Head
40
2.1.3 Scanners
41
Hardware
43
2.1.4 Tipholders
44
2.1.5 Probes
45
Tunneling electrons
48
2.3 Feedback Gains
50
2.3.2 Proportional Gain
51
2.3.3 Integral Gain
52
2.3.4 LookAhead Gain
52
2.3.6 Setpoint
53
Feedback Gains
54
2.4.3 User Example
59
2.5 Review of TappingMode AFM
63
Review of TappingMode AFM
64
2.6 Terms and Abbreviations
66
Terms and Abbreviations
67
3.2 Component List
69
Component List
70
3.2.1 Unpack The System
71
3.2.2 Vibration Isolation
75
3.2.3 System Power Up
76
Silicon Cantilever Substrates
78
Scan direction = 0 deg
80
Scan direction = 90 deg
81
Lever Type
86
Preparation
89
5.1.1 Prepare the Sample
92
5.1.2 Load the Sample
93
Reattach retaining
94
Tip down
94
5.1.3 Load Probe in Tipholder
95
5.1.4 Install the Tipholder
97
5.2 Laser Alignment
98
Laser Alignment
100
5.2.3 Maximize the SUM Signal
103
Start the Microscope Program
104
MultiMode SPM Voltage Meters
105
RMS VERT
106
Chapter 6 Contact AFM Mode
107
• Setpoint: Section 6.5.4
108
6.1.2 Signal Settings
109
6.1.4 Position Tip with OMV
110
6.2.1 Show All Items
111
to 0.0
112
fidence in
115
0.00 nm
115
Initiate the Engage Command
116
6.4.1 Cantilever Selection
118
6.5.1 Data type
119
6.5.2 Gain settings
120
6.5.3 Scan size and Scan rate
120
6.5.4 Setpoint
121
6.5.5 Lowpass filter
121
6.5.6 Highpass filter
121
Chapter 7 TappingMode AFM
123
7.2.1 Switch to TappingMode
125
7.2.2 Show All Items
125
7.2.3 Check Parameters
126
Preparation Prior to Imaging
127
TappingMode AFM
128
7.2.5 Additional preparations
129
7.2.6 Tune the Cantilever
129
7.3 Engaging The Microscope
133
Engaging The Microscope
134
7.4 Withdrawing the Tip
135
50.00 nm/div
136
Scan Size - 2.50 µm/div
136
Chapter 8 Fluid Operation
141
8.1 Introduction
143
8.2 General Fluid Operation
143
General Fluid Operation
144
8.2.2 Select the Probe
145
8.2.5 Sample Mounting
147
Method 1 (with an O-ring)
147
Method 2: Without an O-ring
149
8.2.6 Align the Laser
151
8.2.8 Engage the Surface
152
8.3 TappingMode in Fluids
154
the Scan Rate to 1Hz
155
TappingMode in Fluids
156
8.4 Troubleshooting Tips
158
Troubleshooting Tips
159
8.6.1 Protein Binding Theory
162
8.7 Binding DNA to Mica
165
8.7.3 Acknowledgments
166
Microscopy (STM)
167
9.1 STM Introduction
168
9.1.2 STM Hardware
169
9.1.3 Sample Surface
170
9.1.4 Vibration isolation
170
9.2 Basic STM Operation
171
Basic STM Operation
172
9.3 Spectroscopy with the STM
173
9.3.2 Operation of STS
174
9.4 Troubleshooting for STM
175
9.5 Low-Current STM
176
9.5.2 Hardware Description
177
9.5.3 Precautions
177
9.5.4 Installation
178
Low-Current STM
179
9.5.5 Operation
180
9.5.6 Servicing the Converter
182
9.6 Etching Tungsten Tips
184
9.6.1 Procedure
185
Lateral Force
187
10.1 Basic LFM Operation
188
10.2 Advanced LFM Operation
189
10.2.2 Tip selection
190
High Friction
191
Low Friction
191
Advanced LFM Operation
192
Chapter 11 Force Imaging
195
11.1 Force Plots–An Analogy
197
11.2 Force Calibration Mode
198
Force Calibration Mode
199
11.2.1 Example Force Plot
200
Y Offset
204
11.3.3 Channel 1, 2, 3 Panels
206
Total Force
208
End Mode
209
11.3.6 Menu Bar Commands
210
11.4.2 Helpful Suggestions
212
Deflection
213
0.48 V/div
213
Z Position - 9.27 V/div
213
Setpoint
213
11.4.3 Advanced Techniques
214
11.5.1 Force Plots
219
• Main Controls
221
• Channel 1 Panel
221
11.5.3 High Contact Force
223
11.5.4 Tip Selection
223
11.6 Force Modulation
224
11.6.3 Operating Principle
226
Force Modulation
227
11.6.5 Notes About Artifacts
231
11.8 Force Volume
235
LiftMode
237
Interleave Mode Description
239
12.3 Lift Mode Description
240
12.5.2 Setpoint Selection
242
Imaging
245
Magnetic Force Imaging Theory
246
13.2.1 Procedure
248
Drive Frequency
249
Phase (deg)
249
Amplitude
250
13.2.2 Frequency Modulation
252
13.3.1 Basic Extender
252
13.3.2 Quadrex Extender
253
13.3.3 NanoScope IV
253
13.5.1 MFM Image Verification
254
13.6 Advanced Topics
255
Advanced Topics
256
(Feedback loop
263
NanoScope Controller
265
Electric Force (EFM) Imaging
267
External Voltage
269
Source
269
NanoScope
276
14.4.1 Phase Detection
277
14.4.2 Amplitude Detection
279
Microscope
285
Troubleshooting and Warranty
291
Section 15.8.6
292
15.1 SPM Calibration Overview
295
SPM Calibration Overview
297
15.1.2 Calibration References
300
15.2 Calibration Setup
301
15.3.1 Measure Orthogonality
303
15.4.1 Adjust Mag0 and Arg
304
Mag0 Too Large Mag0 Too Small
305
Arg Too LargeArg Too Small
306
15.4.2 Adjusting Fast Mag1
307
15.4.3 Adjust Slow Mag1
308
Autocalibration
309
SKIP to
310
28.37 µµ
311
15.6 Autocalibration
312
Draw a horizontal line
315
15.8 Calibrating Z
319
Calibrating Z
320
15.8.4 Correct Z Sensitivity
323
Scope mode
325
Measurement
326
• Extended offset der
329
Section 15.8.6)
331
15. Recheck accuracy at 0V
331
15.11.1 False engagement
333
15.11.3 Head does not engage
334
15.11.6 Lines in the image
335
Contact AFM Troubleshooting
336
15.11.10 Poor image quality
337
15.11.14 Image goes white
338
With Streaks Without Streaks
340
With Rings Without Rings
341
15.13.1 Image drifts
343
15.13.2 Leaks
344
15.14.1 Inspection
344
15.14.4 Clean Guide Bushings
347
15.14.5 Lubricate
347
15.14.6 Reinstall
347
15.16.1 Hardware Installation
350
15.16.2 Select scanner
351
15.16.3 Inspect scanner
351
15.18 Warranty
353
Warranty
354
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